Technical Program

Paper Detail

Paper:WEP.P.334
Session:Active Microwave Calibation and New Sensor I
Time:Wednesday, July 25, 17:20 - 19:00
Presentation: Poster
Topic: Sensors and Platforms: Active Microwave
Title: QUALITY ANALYSIS FOR IMAGES ACQUIRED BY A NEW MICROWAVE STARING CORRELATION IMAGING TECHNIQUE
Authors: Yong-Sheng Zhou; Academy of Opto-Electronics, CAS 
 Qi Wang; Academy of Opto-Electronics, CAS 
 Ling-Ling Ma; Academy of Opto-Electronics, CAS 
 Chuan-Rong Li; Academy of Opto-Electronics, CAS 
 Lingli Tang; Academy of Opto-Electronics, CAS 
 Yaokai Liu; Academy of Opto-Electronics, CAS